Low-Pass NGD Numerical Function and STM32 MCU Emulation Test - Archive ouverte HAL Access content directly
Journal Articles IEEE Transactions on Industrial Electronics Year : 2022

Low-Pass NGD Numerical Function and STM32 MCU Emulation Test


This article introduces an original microcontroller unit (MCU) design of numerical low-pass (LP) negative group delay (NGD) function. The innovative theory of the numerical LP-NGD function is developed based on the first-order analog transfer function discretization. The infinite impulse response (IIR) LP-NGD is fundamentally formulated in function of the desired NGD value, cutoff frequency, gain, and the MCU sampling frequency. A STM32 MCU proof-of-concept (POC) is tested to implement the IIR LP-NGD function. Different real-time tests with visualization of input and output analog signals from the MCU LP-NGD POC were performed. As expected, time-advance demonstration tests with milli-second short- and several hour long-duration time-scale with arbitrary waveform signals from temperature and humidity sensors. The signal time-advance is not in contradiction with the causality. The proposed digital MCU function opens a potential future industrial application of LP-NGD function via sensored signal anticipation.
Fichier principal
Vignette du fichier
TIE3109543.pdf (8.23 Mo) Télécharger le fichier
Origin : Files produced by the author(s)

Dates and versions

hal-03509432 , version 1 (07-03-2023)



Blaise Ravelo, Mathieu Guerin, Wenceslas Rahajandraibe, Valentin Gies, Lala Rajaoarisoa, et al.. Low-Pass NGD Numerical Function and STM32 MCU Emulation Test. IEEE Transactions on Industrial Electronics, 2022, 69 (8), pp.8346 - 8355. ⟨10.1109/TIE.2021.3109543⟩. ⟨hal-03509432⟩
43 View
0 Download



Gmail Facebook Twitter LinkedIn More