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Article Dans Une Revue IEEE Transactions on Industrial Electronics Année : 2022

Low-Pass NGD Numerical Function and STM32 MCU Emulation Test

Résumé

This article introduces an original microcontroller unit (MCU) design of numerical low-pass (LP) negative group delay (NGD) function. The innovative theory of the numerical LP-NGD function is developed based on the first-order analog transfer function discretization. The infinite impulse response (IIR) LP-NGD is fundamentally formulated in function of the desired NGD value, cutoff frequency, gain, and the MCU sampling frequency. A STM32 MCU proof-of-concept (POC) is tested to implement the IIR LP-NGD function. Different real-time tests with visualization of input and output analog signals from the MCU LP-NGD POC were performed. As expected, time-advance demonstration tests with milli-second short- and several hour long-duration time-scale with arbitrary waveform signals from temperature and humidity sensors. The signal time-advance is not in contradiction with the causality. The proposed digital MCU function opens a potential future industrial application of LP-NGD function via sensored signal anticipation.

Domaines

Electronique
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Dates et versions

hal-03509432 , version 1 (07-03-2023)

Identifiants

Citer

Blaise Ravelo, Mathieu Guerin, Wenceslas Rahajandraibe, Valentin Gies, Lala Rajaoarisoa, et al.. Low-Pass NGD Numerical Function and STM32 MCU Emulation Test. IEEE Transactions on Industrial Electronics, 2022, 69 (8), pp.8346 - 8355. ⟨10.1109/TIE.2021.3109543⟩. ⟨hal-03509432⟩
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