Energy loss Passivation Nickel Kossel diffraction Topological defects Ferromagnetic resonance Ion implantation Atomic Layer Deposition ALD Acoustic Nanoparticles Raman spectroscopy Growth 6855Jk Evaluation Photoluminescence 17Opp HfO2 Alloys Magnetization curves Multilayer Metal-insulator transition Adsorption Isotherms 27Ald p&α Indium oxide Gold EPR AFM Thin films Density functional theory Zinc oxide Silicon Carbide Annealing XPS 2H Aluminum 7550Ee Nanostructures SiC Alloy Diffusion Adsorbed layers Magnetic semiconductors 7630Lh 13C Silicon 7550Pp Pulsed laser deposition PIXE Nuclear reaction analysis RBS ADSORPTION DESORPTION HYSTERESIS Aluminium 18O resonance NRP Epitaxy Adsorption 27Alda Isotopic Tracing X-ray diffraction Channeling Topological insulators 8140Ef Ion beam analysis Stable isotopic tracing Ageing Thin film Charge exchange Magnetic anisotropy Periodic multilayer Nitridation Silica Epitaxial growth Auger electron spectroscopy AES Oxidation 17O Defects Gallium oxide Oxygen deficiency Silicon carbide GaMnAs Interface defects Transparent conductive oxide TCO Sputtering 18O Capillary condensation Nuclear resonance profiling NRP AC susceptibility Pb centers Acoustic propreties of solid XRD Hysteresis 3C-SiC 27Aldp Al2O3 17Op Low energy electron diffraction LEED Rutherford backscattering spectrometry RBS ALD 15N Measurement